AMAS XV - Workshops

amasxv@csiro.au

Workshops will be held prior to the meeting, on Monday the 11th and Tuesday the 12th of February, at Monash University and CSIRO, both in Clayton. Where required, bus transportation will be provided from the Brighton Savoy to the workshop locations at the start and end of the day.

Morning tea, lunch, and afternoon tea will be provided at the workshop venues. If you have food allergies or special dietary requirements, please contact your workshop coordinator or e-mail the organising committee at amasxv@csiro.au at least two weeks prior to the workshop so that suitable catering may be arranged.

The workshop timetable for AMAS XV is:

Monday, 11th of FebruaryTuesday, 12th of February
Morning (9:00am – 12:30pm) Afternoon (1:30am – 5:00pm) Morning (9:00am – 12:30pm) Afternoon (1:30am – 5:00pm)
Microbeam x‑ray fluor­escence of geological samples (μXRF) Large-area x‑ray mapping Electron energy loss spectroscopy (EELS) in the SEM and TEM High-resolution scanning electron micro­scopy (HR‑SEM)
Mechanical specimen preparation Advanced specimen preparation Introduction to electron probe micro­analysis (EPMA) Advanced electron probe micro­analysis (EPMA)
EM Maintenance Laser Induced Breakdown Spectroscopy (LIBS) Electron back­scatter diffraction (EBSD) - All day
Soft x-ray spectro­scopy / light element analysis - All day Cathodo­luminescence spectro­scopy (CL) - All day

Further details of the workshops, including speakers, topics and detailed programmes, will be posted once confirmed.

Monday Workshops

Soft x-ray spectroscopy / light element analysis

Monday, 11th of February 2019
All day, 9:00am – 5:00pm
CSIRO Mineral Resources, Western Reception, Bayview Ave. Clayton
Coordinator: Mr. Colin MacRae and Dr. Nick Wilson, Microbeam Laboratory, CSIRO Mineral Resources, Clayton

This workshop will cover detection methods for soft x-rays with energies in the range of 35 - 300eV, including both energy-dispersive and grating wavelength-dispersive spectrometers. Topics covered will include applications of SXES to mineral and material problems, as well as technical and practical aspects of SXES analysis such as detector sensitivity and resolution, chemical state determination by SXES, specimen preparation for soft x-ray spectroscopy, specimen and detector contamination, SXES at cryogenic temperatures, and calibration and quantification.

The workshop will include lectures as well as hands-on demonstrations on a JEOL JXA-8530 FEG-EPMA equipped with a CSIRO-modified JEOL SXES spectrometer and Li-sensitive windowless Bruker SDD, as well as a JEOL JSM-7800 Prime FEG-SEM equipped with a JEOL SXES spectrometer.

Workshop presenters

Mechanical specimen preparation

Monday, 11th of February 2019
Morning, 9:00am – 12:30pm
CSIRO Minerals, Western Reception, Bayview Ave. Clayton
Coordinator: Mr. Cameron Davidson, Microbeam Laboratory, CSIRO Mineral Resources, Clayton

This workshop will cover techniques for mounting, grinding and mechanical polishing of specimens for microanalysis. The workshop will also cover techniques for preparing, handling, transferring, and examining specimens of reactive materials, including air- and water-sensitive materials.

Workshop presenters

Advanced specimen preparation

Monday, 11th of February 2019
Afternoon, 1:30pm – 5:00pm
CSIRO Minerals, Western Reception, Bayview Ave. Clayton
Coordinator: Mr. Cameron Davidson, Microbeam Laboratory, CSIRO Mineral Resources, Clayton

This workshop will cover advanced specimen finishing techniques for microanalysis, including ion beam milling, ultra-thin conductive coatings, plasma cleaning, and inert transfer of reactive samples.

Workshop presenters

Microbeam x-ray fluorescence of geological samples (μXRF)

Monday, 11th of February 2019
Morning, 9:00am – 12:30pm
CSIRO Minerals, Western Reception, Bayview Ave. Clayton
Coordinator: Mr. Aaron Torpy, Microbeam Laboratory, CSIRO Mineral Resources, Clayton

This workshop will focus on applications microbeam x-ray fluorescence to geological research and mineral exploration, including trace element detection, gold/PGE searching, mineral phase identification, and rapid characterisation of large specimens (e.g. drill core). The workshop will include discussion of the technical and practical aspects of the now-widespread laboratory-based μXRF systems, as well as high-throughput μXRF instrumentation, and synchrotron μXRF.

Workshop presenters

Large-area x-ray mapping

Monday, 11th of February 2019
Afternoon, 1:30pm – 5:00pm
CSIRO Minerals, Western Reception, Bayview Ave. Clayton
Coordinator: Mr. Aaron Torpy, Microbeam Laboratory, CSIRO Mineral Resources, Clayton

Since the dawn of time, humanity has yearned to map increasingly larger areas by x-ray spectrometry, always straining the boundaries of what is possible with current instrumentation, software, analysis time, and specimen preparation. This workshop will discuss:

  • Applications of large area mapping,
  • Capabilities of current instrumentation and techniques (and limitations thereof),
  • Optimising acquisition parameters for large area maps, including balancing the trade-offs between total map area, spatial resolution, acquisition time, sensitivity/count rates, specimen damage, and detector artefacts, and;
  • Strategies for dealing with the many challenges involved in large area mapping, including (but not limited to) collecting and stitching multi-field maps, maintaining detector sensitivity and focus over large areas, issues with instrument/software stability for long-duration maps, and software considerations for the acquisition, storage and analysis of large amounts of map data.

Workshop presenters

EM Maintenance

Monday, 11th of February 2019
Morning, 9:00am – 12:30pm
CSIRO Minerals, Western Reception, Bayview Ave. Clayton
Coordinator: Dr. Ric Wuhrer, Advanced Materials Characterisation Facility (AMCF), University of Western Sydney, Parramatta

The care and correct maintenance of an SEM is the key aspect for a correctly operating instrument. This workshop will cover many aspects of SEM maintenance. Some of the topics to be covered include: Vacuum Systems and their maintenance, cleaning of microscopes parts such as apertures and wehnelt assembly, basic monitoring of instrument, testing of instrument operation (resolution, magnification calibration), EDS maintenance and calibration, monitoring filament conditions (filament life improvement and setting), and sorting out imaging problems.

The topics to be covered are:

  1. Vacuum Systems
    1. Maintenance
    2. Performance and monitoring
    3. Diffusion and turbo pumps
    4. Specimen contamination rate
  2. Cleaning of microscopes parts
    1. Cleaning by hand and wet cleaning
    2. Column cleaning - apertures and Wehnelt assembly
    3. Cleaning the column
  3. Electron gun
    1. Filament life and type of break
    2. Filament life improvement and setting.
    3. Monitoring filament conditions.
  4. Microscope
    1. Basic monitoring of instrument
    2. Instrument settings (currents and/or control positions)
    3. Testing of instrument operation.
  5. Imaging
    1. Magnification calibration at specific kVs and at specific magnifications.
    2. Resolution test at a range of kV at specific working distances/focal lengths.
    3. Sorting out imaging problems
  6. Detectors (Checking and maintenance)
  7. Monitoring the EDS Detector
    1. EDS Checking
    2. EDX calibration and calibration change
    3. EDX resolution at FWHM on Mn and Al at a specific kV
    4. L to K ratio of a popular element
    5. EDX LN2 quantity per fill (or SDD temperature check)
  8. Electrical System of SEM’s (fuses, power supplies etc)

Workshop presenters

Laser-induced breakdown spectroscopy (LIBS)

Monday, 11th of February 2019
Afternoon, 1:30pm – 5:00pm
CSIRO Mineral Resources, Western Reception, Bayview Ave. Clayton
Coordinator: Mr. Steven Tassios, CSIRO Manufacturing, Clayton

Laser-induced breakdown spectroscopy (LIBS) is a very fast, powerful and flexible spectroscopic analytical technique ideally suited for geological and petrological analysis, as well as analysis of liquids and gases. LIBS is starting to move out of the lab and is finding increasing use in industry, primarily in online monitoring and process control. There is even a LIBS unit on Mars, an integral part of the Curiosity Mars Science Rover! This workshop will discuss the fundamentals of laser-matter interactions that result in a LIBS spectrum, as well as provide numerous examples of where LIBS has been used in CSIRO in the analysis of solids, liquids and gases, both as a benchtop analyser and as an online tool.

The advantages of LIBS are:

  • Little or no sample preparation
  • Analysis of solids, liquids and gases
  • Benchtop or online (real-time) analysis
  • Reaction kinetics can be measured
  • Simultaneous multi-element analysis - including hydrogen!
  • Elemental depth profiles can be measured
  • Rapid elemental mapping of minerals performed with no sample preparation

Workshop presenters

  • Mr. Steven Tassios, CSIRO Manufacturing, Clayton
  • Dr. Doug Body, Elementia Consulting, Melbourne
  • Dr. François R. Doucet, Elemission, Montréal, Canada
  • Dr. Lütfü Özcan, Elemission, Montréal, Canada
  • Dr. Taryn Guinan, Leica Microsystems, Macquarie Park, NSW

Tuesday Workshops

Cathodo­luminescence spectro­scopy (CL)

Tuesday, 12th of February 2019
All day, 9:00am – 5:00pm
Monash Centre for Electron Microscopy (MCEM), Monash University, 10 Innovation Walk, Clayton
Coordinator: Dr. Amelia Liu, Monash Centre for Electron Microscopy, Clayton

Cathodoluminescence (CL) is a powerful technique for mapping electron-induced light emission at the nano and macro scales in geological, plasmonic, photonic and semiconductor materials. CL can probe trace element distributions in minerals, crystal orientation, bandgaps and defects in semiconductors, plasmon modes and photonic band structures in nanophotonic systems and metamaterials. This workshop will discuss the fundamental aspects of electron-induced light generation in these different material classes and what useful information can be obtained using CL. In addition to spatially and spectrally resolved data sets, new opportunities such as time-resolved CL and angle-resolved CL will be highlighted. Experts from materials and minerals fields of research will present and showcase the different applications of the CL to materials and minerals. The workshop will have a hands-on laboratory component using the Delmic SPARC system installed on a Nova Nanosem 450 at the MCEM (Monash University).

Workshop presenters

Electron back­scatter diffraction (EBSD)

Tuesday, 12th of February 2019
All day, 9:00am - 5:00pm
CSIRO Mineral Resources, Western Reception, Bayview Ave. Clayton
Coordinator: Dr. Matthew Glenn, Microbeam Laboratory, CSIRO Mineral Resources, Clayton

The EBSD workshop will be a full day, divided into a theory session in the morning with a practical session in the afternoon.

The morning session will commence with some introductory EBSD lectures discussing the theory of EBSD, and will then move on to acquisition of EBSD datasets, post processing, then, if time permits, some specialist applications, including TKD.

The afternoon session will be divided into three groups for practical demonstrations. We will have three different systems to demonstrate, a Bruker e-Flash system, an Oxford Symmetry system and an EDAX system, including TKD. Participants can select their preferred system for demonstration, however movement between the different demonstrations will be allowed at afternoon tea time, so that more than one system can be experienced. We will also have overseas presenters from Oxford, EDAX, and Bruker, to demonstrate their systems.

Due to popular demand and limited laboratory space for demonstrations, numbers for the EBSD workshop are strictly limited. Register soon to avoid disappointment!

Workshop presenters

Introduction to electron probe micro­analysis (EPMA)

Tuesday, 12th of February 2019
Morning, 9:00am – 12:30pm
CSIRO Mineral Resources, Western Reception, Bayview Ave. Clayton
Coordinator: Mr. Colin MacRae and Dr. Nick Wilson, Microbeam Laboratory, CSIRO Mineral Resources, Clayton

This half-day workshop will focus upon the theory and practice of electron probe microanalysis. It is intended to provide a good introduction for newcomers, as well as a refresher for more experienced users. Input from participants will be welcomed (e.g., specific questions, analytical problems).

Topics will include:

  • Basics of X-ray production (analytical volume, characteristic and continuum x-rays)
  • WDS and EDS X-ray spectrometry (detection, pulse processing, deadtime correction, calibration)
  • Setting up a quantitative analysis run (EDS vs. WDS, standards, spectrometers, strategy, evaluation of results)
  • Matrix correction (ZAF, phi-rho-Z, example compositional systems)
  • Microanalysis standards
  • Software tools for optimizing EPMA (e.g. CASINO, DTSA, CalcZAF, VirtualWDS)
  • Instrumental performance and calibration, procedures, internal consistency of data
  • Evaluating analyses and analytical runs, detecting and correcting problems
  • Secondary X-ray fluorescence

This workshop will include lectures covering such procedures as performing quantitative analysis, peak scanning and PHA optimisation, and any other subjects of interest to workshop attendees.

Workshop presenters

  • Mr. Paul Carpenter, Washington University in St. Louis.
  • Dr. Karsten Goemann, Electron Microscopy and X-Ray Microanalysis Facility, University of Tasmania, Hobart.
  • Mr. Hiroyuki Yamada, Head of Surface Analysis BU, JEOL Ltd., Tokyo, Japan.
  • Mr. Colin MacRae, Microbeam Laboratory, CSIRO Mineral Resources, Clayton.
  • Dr. Nick Wilson, Microbeam Laboratory, CSIRO Mineral Resources, Clayton.

Advanced electron probe micro­analysis (EPMA)

Tuesday, 12th of February 2019
Afternoon, 1:30pm – 5:00pm
CSIRO Mineral Resources, Western Reception, Bayview Ave. Clayton
Coordinator: Mr. Colin MacRae and Dr. Nick Wilson, Microbeam Laboratory, CSIRO Mineral Resources, Clayton

This half-day workshop will delve into the theory and practice of advanced applications of electron probe microanalysis.

Topics will include:

  • Low-voltage microanalysis
  • WDS spectroscopy, peak shifts, polarisation
  • WDS background measurement, trace element analysis
  • Compositional mapping and quantitative analysis, image processing
  • Software demonstration of JEOL EPMA, xCLent, and 'Probe for EPMA' software for point analysis and mapping
  • Beam sensitive samples
  • Microanalysis of reactive samples
  • Cryogenic EPMA

In addition to lectures, there will be hands-on sessions with two field-emission EPMAs (JEOL JXA-8500F and 8530F), covering practical aspects of the above topics.

Workshop presenters

  • Mr. Paul Carpenter, Washington University in St. Louis.
  • Dr. Karsten Goemann, Electron Microscopy and X-Ray Microanalysis Facility, University of Tasmania, Hobart.
  • Mr. Hiroyuki Yamada, Head of Surface Analysis BU, JEOL Ltd., Tokyo, Japan.
  • Mr. Colin MacRae, Microbeam Laboratory, CSIRO Mineral Resources, Clayton.
  • Dr. Nick Wilson, Microbeam Laboratory, CSIRO Mineral Resources, Clayton.
  • Mr. Aaron Torpy, Microbeam Laboratory, CSIRO Mineral Resources, Clayton.

Electron energy loss spectro­scopy (EELS) in the TEM and SEM

Tuesday, 12th of February 2019
Morning, 9:00am – 12:30pm
CSIRO Mineral Resources, Western Reception, Bayview Ave. Clayton
Coordinators: Prof. Raynald Gauvin, McGill University, and Prof. Nestor Zaluzec, Argonne National Laboratory

In this workshop we will review the basic instrumentation, operating modes and equipment available for today's modern EM instruments, as they apply to electron loss spectroscopy and related microanalysis techniques to facilitate materials characterization. We will discuss the use of spectroscopy at high and low accelerating voltages as well as opportunities for ultrahigh energy resolution. This workshop can serve as a introduction to the techniques for the novice as well as a refresher for those who are returning to the field. The majority of the topics covered will be taken from materials science perspective, however, examples from soft matter and life sciences will be included as appropriate.

Electron Energy Loss Spectroscopy

  • Brief Review of Electron Loss Processes
  • Electron Scattering Distributions
  • Instrumentation - Electron spectrometers
    • Basic Principles
    • Electrostatic/Electromagnetic
    • Serial/Parallel Detector Systems
    • Spectral Artifacts
  • The Microscope/Detector System
    • Interfacing and Geometries in the AEM
    • Optimizing Conditions
  • Data Analysis/Spectral Processing
  • Quantification
    • Thin Film Methods
      • Standardless
      • Standards
    • Multiple Scattering Corrections
  • NES/NEXAFS Information
  • Low Loss/Plasmonics
  • UltraHigh Energy Resolution

Additional Topics & Open Discussion Session

  • Specimen Damage
  • Channeling
  • HyperSpectral Imaging
  • Li Detection
  • Open Discussion

Workshop presenters

High-resolution scanning electron microscopy (HR SEM)

Tuesday, 12th of February 2019
Afternoon, 1:30pm – 5:00pm
Monash Centre for Electron Microscopy (MCEM), Monash University, 10 Innovation Walk, Clayton
Coordinator: Dr. Peter Miller, Monash Centre for Electron Microscopy (MCEM), Monash University, Clayton

High resolution scanning electron microscopes (HR-SEM) with resolution better than 1nm have been available for more than thirty years. Two important differences between a conventional SEM and a HR SEM are that the HR SEM uses a strong immersion lens and it is designed to minimise the effect of chromatic aberration at low operating voltage. The HR SEM may also have beam deceleration. Manufacturers have developed a variety of column designs and detectors including in-lens detectors for their HR SEMs allowing formation of images using a wide range of contrast mechanisms.

The HR SEM workshop will cover the following topics:

  • Overview of HR-SEM
  • Resolution – definitions and measurement
  • Presentations by representatives for several manufacturers about their HR-SEMs
  • General discussion

Workshop presenters

  • Dr Peter Miller, Monash Centre for Electron Microscopy (MCEM), Monash University, Clayton
  • Dr. Asahina, JEOL FE SEM Application, Tokyo, Japan.
  • Mr. Ian Cotton, Hitachi High Technologies Canada, Toronto, Canada.
  • Additional speakers to be confirmed.